In this work, we present the manipulation of zinc oxide microrods grown through aqueous chemical growth method via atomic force microscopy (AFM). The synthesized rods are found to strongly adhere to the silicon substrate, thus allowing for a raster AFM scan to be obtained. During manipulation, the oscillating cantilever is brought near the rod while the z-scanner feedback is disabled, until its oscillation amplitude reached 1-5% of the initial value. The rods are moved to desired locations which were verified by the imaging capability of AFM. In line with this, the motion of the cantilever followed a drawn path as was done in AFM lithography. In this way, the manipulation forces can be measured and analyzed. In terms of applications, the AFM manipulation technique could enable the fabrication of sophisticated zinc oxide based micro- and nano-devices, which would be of potential use in the fields of atomic-scale and nanostructure-based device integrations.
Zinc Oxide, Microstructures/Microrods, Aqueous Chemical Growth, AFM Manipulation
Alexandra Bernardo Santos-Putungan; Bess Garcia Singidas; Roland Villano Sarmago, Manipulation of low temperature grown ZnO rigid structures via Atomic Force Microscope, HCTL Open International Journal of Technology Innovations and Research (IJTIR), Volume 11, September 2014, e-ISSN: 2321-1814, ISBN (Print): 978-1-62951-780-3.